Detection of Tiniest Impurities in Hexachlorodisilane (HCDS)

PSC Polysilane Chemistry GmbH manufactures a complete portfolio of processes for the synthesis, separation, and purification of high-performance materials for high-tech applications. In order to continuously monitor the production process of hexachlorodisilane (HCDS) and to verify the purity of the products by means of a certificate of analysis, a method is required to quantify the trace element content in the product.

The Fraunhofer CSP has developed a method for the chemical digestion of hexachlorodisilane, which can be used to analyze trace element contents down to the ppt range. PSC GmbH can now include a corresponding analysis certificate with every batch of HCDS sold, which is based on our analyses and shows the customer transparently which impurities are contained in the material and in what quantities.