Fraunhofer Center for Silicon Photovoltaics CSP
Fraunhofer Center for Silicon Photovoltaics CSP

Research Infrastructure H2 Material Diagnostics

Available characterization methods for H2 electrolyzer components, covering a size range from centimeters to nanometers.
© Fraunhofer CSP
Available characterization methods for H2 electrolyzer components, covering a size range from centimeters to nanometers.
Schematic view of multi-method approach - from large sample to atomic resolution
© Fraunhofer CSP
From large sample to atomic resolution – our multi-method approach provides all the information you need about your H2 electrolyzer components.
  • Multi-method approach: Our characterization methods cover H2-electrolyzer components across a size range from meters to nanometers, delivering critical insights from large samples to atomic resolution.

 

  • Questions? Get in direct touch with our method experts for any inquiries about specific techniques via our CONTACT FORM

 

  • State-of-the-art equipment: We provide a comprehensive range of advanced tools and methods to address all characterization aspects of your H2-projects, from fundamental research to manufacturing or quality assurance:

Microstructure Diagnostics

Plasma-FIB for advanced cross section and TEM lamellae preparation
© Fraunhofer CSP
Plasma-FIB for advanced cross section and TEM lamellae preparation.
  • SEM: Scanning Electron Microscopy
  • TEM: Transmission Electron Microscopy with high sensitivity EDX
  • FIB: Focused Ion Beam (Ga+, Plasma)
  • XPS: X-Ray Photoelectron Spectroscopy
  • XTM: X-Ray transmission microscopy
  • µCT and CT: Computer Tomography with 3D reconstruction
  • SnV: Slice-and-View with FIB-SEM with 3D reconstruction
  • AFM: Scanning Probe Microscopy
  • SAM: Scanning Acoustic Microscopy

Material Analytics

UHV chamber of the ToF-SIMS
© Fraunhofer CSP
In the UHV chamber of the ToF-SIMS the chemical composition of a sample is determined with the aid of ion-sputtering sources.
  • XRD: X-Ray Diffractometry
  • XRF: X-ray fluorescence
  • EDS: Energy-dispersive X-ray spectroscopy at SEM or TEM
  • ToF-SIMS: Time of Flight Secondary Ion Mass Spectrometry
  • Other MS: Mass Spectroscopy
    • ICP-MS: High-resolution ICP Mass Spectrometry
    • GD-MS: Glow discharge Mass Spectrometry
    • GC-MS: Gas Chromatograph Mass Spectrometry
  • ICP-OES: ICP Optical emission Spectrometry
  • LIBS: Laser Induced Breakdown Spectroscopy
  • TGA: Thermal Gravimetric Analysis
  • RGA: Residual Gas Analysis
  • NMR: Nuclear Magnetic Resonance Spectroscopy

Optical Methods

PTL of a PEM-Stack analyzed with an optical microscope.
© Fraunhofer CSP
PTL of a PEM-Stack analyzed with an optical microscope.
  • Microscopy (optical, NIR, laser-scanning, 3D)
  • Raman: Raman spectrometer (micro- and macro-Raman)
  • Height Measurement: Optical profilometer (Cyberscan)
  • UV-Vis-NIR fluorescence spectrometer
  • FT-IR: Fourier transform infrared spectrometer
  • Spectral ellipsometer
  • Hyperspectral imaging
  • WLT: White Light Interferometry

Electrical Characterization

4-prope measurement with electrical micro manipulators
© Fraunhofer CSP
4-prope measurement with electrical micro manipulators.
  • Micro probing: Resistivity, I-V curves and 4 point measurements
  • Resistivity under variable force/pressure: In-plane and through-plane
  • TLM: Transfer Length Method for contact resistance determination
  • ECT: Eddy current testing
  • MFA/MFI: Magnetic Field Analysis and Imaging (customizable robotic arm available)
  • EBAC: Electron Beam Absorbed Current Measurement (in SEM)
  • EIS: Electrochemical Impedance Spectroscopy (variable AC frequencies)

Thermal Imaging Techniques

Lock-in thermography of a CCM shows high and low resistance by thermal differences
© Fraunhofer CSP
Lock-in thermography of a CCM shows high and low resistance by thermal differences.
  • LIT: Lock-In Thermography
  • HV-LIT: High-Voltage Lock-In Thermography
  • VACE-LIT: Variable AC frequency Excited Lock-In Thermography
  • H2-LIT: Lock-In Thermography with catalytic heat generation under pulsed H2 application (for sensitive detection of pinholes)

Material Testing, Accelerated Stress Tests, Aging Experiments

Test bench with eight autoclaves for accelerated stress tests and aging experiments.
© Fraunhofer CSP
Test bench with eight autoclaves for accelerated stress tests and aging experiments.
  • Mechanical Testing
    • tensile testing
    • compression set
    • Young‘s modulus
    • elongation at break
    • micro- and nanoindentation
  • Chemical Testing in autoclaves
    • variable pressure, temperature,
    • acids for leaching experiments
    • leaking & transmission rates
    • ion releases and more)
  • Accelerated Stress Tests
    • With customizable procedures (can including testings above)

Laser Processing

Selective laser ablation of a Bipolar Plate (BPP) with ultra-short fs pulses.
© Fraunhofer CSP
Selective laser ablation of a Bipolar Plate (BPP) with ultra-short fs pulses.
  • Ultra-short pulse (fs) and short pulse (ns) Laser: for selective laser ablation and high-throughput preparation (possibility for gas analyzation) or sample structuring