Volker Naumann

Profile

Dr. Volker Naumann, Team Leader Surface and Film Characterization

Main Research

 

  • Potential-induced degradation (PID) of solar cells: Investigation of causes, modelling from the solar cell to the system, development of test methods
  • Layer analysis: chemical characterization of layers and interfaces by means of sensitive surface analysis (XPS, ToF-SIMS) and (analytical) electron microscopy (SEM, EBIC, TEM, STEM/EDX) in combination with target preparation methods (e.g. FIB); layer preparation by magnetron sputtering
  • Electrical micro-characterization: local electrical characterization, layer and transition resistance determination and defect diagnostics down to the micrometer scale; characterization of insulators under high electrical field strengths

 

Academic Résumé

 

  • since 2017

    Team leader »Surface and Layer Characterization«

  • since 2015 

    Research fellow group Diagnostics and Metrology at Fraunhofer CSP   

 

Training

 

  • 2010-2014

    Doctorate (with distinction) at Martin-Luther-University Halle-Wittenberg and Fraunhofer CSP on the topic »Cause analysis and physical modelling for potential-induced degradation of silicon solar cells«

  • 2004 - 2009

    Diploma in physics at Martin-Luther-University Halle-Wittenberg
    Diploma thesis at Fraunhofer CSP: »Microstructure investigations and electrical characterization of local contacts on solar cells«

 

Prizes and Awards

 

  • V. Naumann, N. Schüler, C. Hagendorf, Best Poster Award, SNEC 2018 Scientific Conference in Area PV Modules & Systems für den Posterbeitrag Rapid PID testing and assessment of PID stability at installed PV modules
  • K. Ilse, J. Rabanal, L. Schönleber, M. Khan, V. Naumann, C. Hagendorf, J. Bagdahn, Best Student Paper Award auf der 44th IEEE PVSC in Washington DC am 29.06.2017 für "Comparing indoor and outdoor soiling experiments for different glass coatings and microstructural analysis of particle caking processes"
  • V. Naumann,DIN Innovationspreis 2017 für das Projekt "DIN SPEC 91348 - Prüfung von kristallinen Silicium-Solarzellen auf die Anfälligkeit für Potential-induzierte Degradation"
  • V. Naumann, D. Lausch, N. Schüler, C. Hagendorf, Best Poster Award der 26th International Photovoltaic Science and Engineering Conference (PVSEC-26) für den Posterbeitrag "Outdoor PID testing of modules in PV systems", 28.10.2016, Singapur
  • V. Naumann, Werkstoff-Preis 2016 der Schott AG für die Promotionsarbeit "Ursachenanalyse und physikalische Modellbildung für Potential-induzierte Degradation von Silizium-Solarzellen", 08.06.2016, Halle
  • V. Naumann, C. Hagendorf, D. Lausch, Ein PID-Testverfahren für Solarzellen und Solarmodulkomponenten, das Kosten und Zeit spart, Anerkennungspreis in der Kategorie "Lokaler Wissenschaftspreis des IQ Innovationspreis Mitteldeutschland", 07.07.2015, Halle
  • V. Naumann, Luther-Urkunde für die mit Auszeichnung bewertete Dissertation "Ursachenanalyse und physikalische Modellbildung für Potential-induzierte Degradation von Silizium-Solarzellen", 03.06.2015, Halle
  • V. Naumann, D. Lausch, K. Dornich, C. Hagendorf, Finalist für den Intersolar Europe Award 2015 mit der Einreichung "PIDcon: A PID Quick Test for Solar Cells and Module Components", 22.06.2015, München
  • V. Naumann, Finalist (beste 4) für den SolarWorld Junior Einstein Award 2015 mit der Dissertation "Ursachenanalyse und physikalische Modellbildung für Potential-induzierte Degradation von Silizium-Solarzellen", 22.05.2015, Freiberg (Sachsen)
  • V. Naumann, J. Bauer, O. Breitenstein, S. Großer, C. Hagendorf, D. Lausch, M. Schütze, SiliconPV Award (2. Platz) der 3rd International Conference on Crystalline Silicon Photovoltaics 2013 für den Beitrag "Towards a physical model for potential-induced degradation (PID) of silicon solar cells", 27.03.2013, Hameln
  • V. Naumann, D. Lausch, S. Großer, M. Werner, S. Swatek, C. Hagendorf, J. Bagdahn, Best Poster Award der PV Asia Pacific Conference 2012 für den Posterbeitrag "Spatially resolved microstructural root cause anaysis of potential-induced degradation (PID) of solar cells", 25.10.2012, Singapur

 

Publications

Selection from 29 refereed articles, 70 conference papers and 11 other publications:

 

Refereed Professional Articles:

  • K. Ilse, B. W. Figgis, M. Werner, V. Naumann, C. Hagendorf, H. Pöllmann, J. Bagdahn, Comprehensive analysis of soiling and cementation processes on PV modules in Qatar, Solar Energy Materials and Solar Cells 186, 309-323 (2018).
  • K. Ilse, B. Figgis, V. Naumann, C. Hagendorf and J. Bagdahn, Fundamentals of soiling processes on photovoltaic modules, Renewable and Sustainable Energy Reviews 98, 239-254, 2018.
  • V. Naumann, O. Breitenstein, J. Bauer, C. Hagendorf, Search for Microstructural Defects as Nuclei for PID-Shunts in Silicon Solar Cells, Proceedings of 44th IEEE PVSC, Washington, DC (USA), 1376-1380 (2017).
  • K. Ilse, J. Rabanal, L. Schönleber, M. Z. Khan, V. Naumann, C. Hagendorf, and J. Bagdahn, Comparing Indoor and Outdoor Soiling Experiments for Different Glass Coatings and Microstructural Analysis of Particle Caking Processes, Journal of Photovoltaics 8 (1), 203-209 (2017).
  • W. Luo, Y. S. Khoo, P. Hacke, V. Naumann, D. Lausch, S.P. Harvey, J. P. Singh, J. Chai, Y. Wang, A. G. Aberle and S. Ramakrishna, Potential-induced Degradation in Photovoltaic Modules: A Critical Review,  Energy Environ. Sci. 10, 43-68 (2017). DOI: 10.1039/C6EE02271E
  • V. Naumann, C. Brzuska, M. Werner, S. Großer, C. Hagendorf, Investigations on the formation of stacking fault-like PID-shunts, Energy Procedia 92, 569-575 (2016).
  • K. Ilse, M. Werner, V. Naumann, B. W. Figgis, C. Hagendorf, J. Bagdahn, Microstructural analysis of the cementation process during soiling on glass surfaces in arid and semi-arid climates, physica status solidi (RRL) 10 (7), 509–572 (2016).
  • V. Naumann, D. Lausch, C. Hagendorf, Sodium decoration of PID-s crystal defects after corona induced degradation of bare silicon solar cells, Energy Procedia 77, 397-401 (2015).
  • V. Naumann, D. Lausch, A. Hähnel, O. Breitenstein, C. Hagendorf, Nanoscopic studies of 2D-extended defects in silicon that cause shunting of Si-solar cells, physica status solidi (c) 12 (8), 1103–1107, 2015.
  • V. Naumann, T. Geppert, S. Großer, D. Wichmann, H.-J. Krokoszinski, M. Werner, C. Hagendorf, Potential-Induced Degradation at Interdigitated Back Contact Solar Cells, Energy Procedia 55, 498-503 (2014).
  • V. Naumann, D. Lausch, A. Hähnel, J. Bauer, O. Breitenstein, A. Graff, M. Werner, S. Swatek, S. Großer, J. Bagdahn, C. Hagendorf, Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cells, Sol. Energ. Mat. Sol. Cells 120, 383 (2014).
  • V. Naumann, D. Lausch, A. Graff, M. Werner, S. Swatek, J. Bauer, A. Hähnel, O. Breitenstein, S. Großer, J. Bagdahn, C. Hagendorf, The role of stacking faults for the formation of shunts during potential-induced degradation of crystalline Si solar cells, pss (RRL) 7 (5), 315, (2013).
  • V. Naumann, C. Hagendorf, S. Großer, M. Werner, J. Bagdahn, Micro Structural Root Cause Analysis of Potential Induced Degradation in c-Si Solar Cells, Energy Procedia 27, 1 (2012).
  • V. Naumann, M. Otto, R. B. Wehrspohn, C. Hagendorf; Chemical and structural study of electrically passivating Al2O3/Si interfaces prepared by atomic layer deposition, J. Vac. Sci. Technol. A 30 (4) 04D106, 2012.

 

Conference Papers:

  • V. Naumann, N. Schüler, C. Hagendorf, Rapid PID testing and assessment of PID stability at installed PV modules, 11th SNEC International Photovoltaic Power Generation Conference & Exhibition 2018, Shanghai (China), 27.-29.5.18.
  • V. Naumann, O. Breitenstein, J. Bauer, C. Hagendorf, New Perspectives on the Sources of PID-s in Silicon Solar Cells, 27th Workshop on Crystalline Silicon Solar Cells & Modules: Materials and Processes, Breckenridge (USA), 2017, eingeladener Vortrag.
  • V. Naumann, O. Breitenstein, J. Bauer, C. Hagendorf, Search for microstructural defects as nuclei for PID-shunts in silicon solar cells , Proceedings of 44th IEEE PVSC, Washington, DC (USA), 2017.
  • V. Naumann, O. Breitenstein, D. Lausch, C. Hagendorf, Investigations on the formation of stacking faults leading to PID-shunting, 26th International Photovoltaic Science and Engineering Conference (PVSEC-26) Singapur, Okt. 2016, eingeladener Vortrag.
  • V. Naumann, D. Lausch, A. Hähnel, J. Bauer, O. Breitenstein, A. Graff, M. Werner, S. Swatek, S. Großer, J. Bagdahn, C. Hagendorf, Towards a physical model for potential-induced degradation (PID) of silicon solar cells, 3rd SiliconPV, Hameln, 2013.
  • V. Naumann, D. Lausch, S. Großer, M. Werner, S. Swatek, C. Hagendorf, J. Bagdahn, Spatially resolved microstructural root cause anaysis of potential-induced degradation (PID) of solar cells, PV Asia Pacific Conference, Singapur, 2012.
  • V. Naumann, C. Hagendorf, S. Großer, M. Werner, J. Bagdahn, Micro Structural Root Cause Analysis of Potential Induced Degradation in c-Si Solar Cells, 2nd SiliconPV, Leuven (Belgien), 2012.
  • V. Naumann, M. Otto, C. Hagendorf, Chemical and structural properties of Al2O3/Si interfaces by atomic layer deposition, International Symposium on Surface Science ISSS-6, Tokio (Japan) 2011.